000 01885cam a2200337 a 4500
001 00005111
003 AR-BaUFI
005 20141030152224.0
008 980904s1995 xxu||||| |||||||||||eng|c
020 _a0126822409
040 _aAR-BaUFI
044 _axxu
_cus
080 0 _a621.382
084 _aT136
100 1 _aTakeda, Eiji
_913730
245 0 0 _aHot-carrier effects in MOS devices
260 _aSan Diego, CA. :
_bAcademic Press,
_c1995
300 _a312 p. :
_bgráfs. ;
_c22 cm
650 7 _aPORTADORES DE CARGA
_2EIT
_920657
650 7 _aPORTADORES CALIENTES
_2EIT
_920656
650 7 _aMATERIALES SEMICONDUCTORES
_2EIT
_919690
650 7 _aELECTRONICA
_2SP
_917623
650 7 _aFISICA
_2EIT
_918325
700 1 _aMiura-Hameda, Akemi
_99821
700 1 _aYang, Cary Y.
_915043
786 1 _oAIG
942 _fBKS
_n0
985 _aREF
997 _aMONOGRAFIA
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