Hot-carrier effects in MOS devices
By: Takeda, Eiji
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Contributor(s): Miura-Hameda, Akemi
| Yang, Cary Y
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Item type | Current location | Home library | Call number | Status | Date due | Barcode |
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Biblioteca Central | Biblioteca Central | 621.382, T136 (Browse shelf) | Available | P26123_1 |