Methdologies of pattern recognition 

 - New York :   Academic Press,   1969 
 - xi, 578 p. :   il. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>INFORMATICA<br/>INTELIGENCIA ARTIFICIAL<br/>ESTADISTICA
<br/><br/><label>Universal Decimal Class. No.: </label>004.8